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A New Platform For Testing Complex Control Systems - Part 2

Later this month, LHP is releasing a new product into our model-based design and test workflow at the Automotive Testing Expo in Novi, MI. The LHP Hardware-in-the-Loop Test Platform (LHP/HTP) supports verification and validation of embedded systems development.

 

This is the second blog in a three-part interview series that highlights the new LHP/HTP (If you missed part one, click here).

 

Howard Moore is a Hardware Engineering Manager at LHP Engineering Solutions, and supports hardware product development and technical sales. In this interview, he’ll provide details on the hardware specifications for the LHP/HTP.

 

Howard Moore Interview

 

Brianna: What is the purpose of the LHP Hardware-in-the-Loop Testing Platform (LHP/HTP) hardware architecture?
Howard: The hardware architecture provides a flexible IO and load interface for the target device under test (DUT).  IO lines can be scaled and isolated from the base NI system to provide flexible test and measurement capability without the need to reconfigure and protect the base system when switching between different DUT platforms.

 

Brianna: What hardware interfaces are available on the LHP/HTP?
Howard: The demo system being shown at the Automotive Testing Expo from October 20th – 22nd in Novi, MI, has:

  • 28 fuel injector loads with timing and current measurement capability
  • 4 CAN 2.0B busses with “rest of bus” simulation
  • 96 analog outputs
  • 32 digital outputs
  • 8 analog inputs
  • 33 low current loads
  • 12 frequency outputs
  • 4 frequency inputs
  • 28 high current loads with pulse width measurement
  • 33 low current loads

 

If needed, we can expand the hardware interfaces to fit client specific application.

 

Brianna: What special operating features and functions are available for the users?
Howard: The LHP/HTP is fault tolerant, meaning fault insertion can be performed via external means without doing damage to the test platform. The user interface panel provides scope probe friendly test points for all analog and frequency signals, as well as LED indicators for digital IO and loads.

 

Brianna: What capabilities does the LHP/HTP have to reconfigure or adapt interfaces?
Howard: We are always looking at ways by which we can improve efficiency for our clients and at the same time provide maximum return on their investment into our products. The IO conditioning cards used in the LHP/HTP can be added, modified, or re-configured as required, based on the needs of the device under test (DUT). This allows the system to be modified or adapted to several DUT types without significant impact to the budget.

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